Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring
نویسندگان
چکیده
منابع مشابه
Optimum Constant-stress Partially Accelerated Life Tests for the Truncated Logistic Distribution under Time Constraint
This paper presents an optimum design of constant-stress partially accelerated life test (PALT) plan in which each item runs either at use or accelerated condition and product life follows Truncated Logistic distribution truncated at point zero under type-I censoring. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. The optimal sample propo...
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ژورنال
عنوان ژورنال: Applied Mathematical Modelling
سال: 2010
ISSN: 0307-904X
DOI: 10.1016/j.apm.2010.02.007